National Repository of Grey Literature 3 records found  Search took 0.01 seconds. 
Analog Circuits Faults Diagnosis
Váško, Ondřej ; Kolka, Zdeněk (referee) ; Kincl, Zdeněk (advisor)
The main goal of this work is to present the issue of testing analogue linear circuits in terms of diagnosis of single components for which it is sought to prove their nominal values. It is necessary for the work to introduce methods of describing linear circuits via the node voltage method (MUN), and production of transmissive functions. The Matlab and PSpice programmes are used to do the diagnoses. The testing of single parameters of the circuit is carried out through proper placing of testing points in the circuit the way in which their number is as small as possible. Through transmissive functions we indirectly state the values of components operating on calculated frequencies. The set of frequencies for the components is figured out using the stochastic method.
Analog Circuits Faults Diagnosis
Váško, Ondřej ; Kolka, Zdeněk (referee) ; Kincl, Zdeněk (advisor)
The main goal of this work is to present the issue of testing analogue linear circuits in terms of diagnosis of single components for which it is sought to prove their nominal values. It is necessary for the work to introduce methods of describing linear circuits via the node voltage method (MUN), and production of transmissive functions. The Matlab and PSpice programmes are used to do the diagnoses. The testing of single parameters of the circuit is carried out through proper placing of testing points in the circuit the way in which their number is as small as possible. Through transmissive functions we indirectly state the values of components operating on calculated frequencies. The set of frequencies for the components is figured out using the stochastic method.
Investigating of Relations between Fault-Coverage and Testability of Electronic Systems
Rumplík, Michal ; Puš, Viktor (referee) ; Strnadel, Josef (advisor)
This work deals with testability analysis of digital circuits and fault coverage. It contains a desription of digital systems, their diagnosis, a description of tools for generating and applying tests and sets of benchmark circuits. It describes the testing of circuits and experimentation in tool TASTE for testability analysis and commercial tool for generating and applying tests. The experiments are focused on increase the testability of circuits.

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